This application trains ML models on wafer sensor data and classifies if the wafers are Good or Bad. The dataset contains wafer names and 590 columns of different sensor values for each wafer. Datasets for training and prediction are provided separately as a set of csv files. A 'schema' file is used to verify the data format. Logging is performed frequently and log files are stored in the Prediction and Training specific log folders. The code for this application can be found here.
Application Access: The application is deployed on HEROKU and can be accessed via POSTMAN
Libraries Used: