Wafer Classification

This application trains ML models on wafer sensor data and classifies if the wafers are Good or Bad. The dataset contains wafer names and 590 columns of different sensor values for each wafer. Datasets for training and prediction are provided separately as a set of csv files. A 'schema' file is used to verify the data format. Loggin is performed frequently and log files are stored in the Prediction and Training specific log folders.

Application Access: The application can be accessed via POSTMAN

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Libraries Used:

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